Quantitative analysis of EPR and electron-nuclear double resonance spectra ofDcenters in amorphous silicon: Dangling versus floating bonds
- 15 April 1988
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 37 (11), 6579-6582
- https://doi.org/10.1103/physrevb.37.6579
Abstract
We report a quantitative analysis of the EPR and electron-nuclear double resonance (ENDOR) data associated with the D center in amorphous Si and show that they support the recent suggestion that D centers are not dangling bonds (threefold-coordinated Si atoms) as commonly believed but instead are ‘‘floating bonds’’ (fivefold-coordinated Si atoms). The localization properties of the D-center wave function are shown to be significantly different from those of the center at the Si- interface and from model calculations of dangling bonds. They are, on the other hand, consistent with the predicted properties of floating bonds. We conclude that floating bonds are a stronger candidate for the D center. It is suggested that ENDOR data in material may provide a further test of this conclusion.
Keywords
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