Etch-pit morphology of tracks caused by swift heavy ions in natural dark mica
- 28 January 2004
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 218, 466-471
- https://doi.org/10.1016/j.nimb.2004.01.009
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Heavy-ion induced defects in phlogopite imaged by scanning force microscopySurface and Coatings Technology, 2002
- The triangular track contours in phlogopite mica detectors and discontinuity of the etchable damageNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1998
- Swift heavy ions in insulating and conducting oxides: tracks and physical propertiesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1994