Modification of a Cosslett-Nixon Microfocus X-Ray Tube for Use as an X-Ray Microanalyzer

Abstract
A Cosslett‐Nixon type microfocus x‐ray tube has been modified for use as an electron probe microanalysis unit, producing an electron beam of adequate intensity approximately one micron in diameter. The design of the unit is discussed, and a description of the electron optical design and the associated electronic power supplies is included.

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