Correlation of HgCdTe epilayer defects with underlying substrate defects by synchrotron x-ray topography
- 1 May 1991
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 9 (3), 1840-1846
- https://doi.org/10.1116/1.585809