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An Application of White Light Interferometry in Thin Film Measurements
Home
Publications
An Application of White Light Interferometry in Thin Film Measurements
An Application of White Light Interferometry in Thin Film Measurements
CL
C. Lin
C. Lin
RS
R. F. Sullivan
R. F. Sullivan
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1 May 1972
journal article
Published by
IBM
in
IBM Journal of Research and Development
Vol. 16
(3)
,
269-276
https://doi.org/10.1147/rd.163.0269
Abstract
No abstract available
Cited by 41 articles