Abstract
The xenon‐sensitized decomposition of methane and methane–ethylene mixtures has been investigated in the vapor phase at 1470 Å. Quantum yield determinations and analyses of the isotopic composition of the hydrogens and ethanes obtained from CH4–CD4(1:1) mixtures under various conditions indicate that sensitization occurs by at least two concurrent mechanisms. The role of internal photolysis by resonating 1470‐Å radiation was found to be negligible in all mixtures, and the existence of XeH as an important intermediate was inferred by chemical methods.

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