Automatic material characterization at microwave frequencies
- 1 June 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 37 (2), 280-284
- https://doi.org/10.1109/19.6067
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- The effects of thermal activation on the complex conductivity of Ag2HgI4 in the microwave regionSolid State Communications, 1980
- Automatic measurement of complex dielectric constant and permeability at microwave frequenciesProceedings of the IEEE, 1974