Abstract
The characterisation of the capacitance matrix of a multilayer and multiconductor transmission-line system is very important in the development of microwave integrated circuits. Many practical multilayer and multiconductor configurations are just special cases of the general configuration described in the letter. The method presented is based on the variational principle. The determination of the capacitance matrix of a generalised N-layer and N-strip transmission-line system is programmable on a digital computer. It should be realised that the transverse-transmission-line concept does indeed make the application of the variational analysis to a multilayer and multiconductor system a relatively simple task.