Measurement of resistive transition to superconductivity in thin aluminum films
- 15 January 1970
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 8 (2), 79-82
- https://doi.org/10.1016/0038-1098(70)90576-4
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Electrical Conductivity of a SuperconductorPhysical Review B, 1969
- Fluctuation Rounding of the Resistive Superconducting Transition in Thin Lead FilmsPhysical Review B, 1969
- The rounding of the resistive transition in metallic lead filmsPhysics Letters A, 1968
- Anomalous Electrical Conductivity above the Superconducting TransitionPhysical Review B, 1968
- Thickness dependence of the resistive transition of superconducting filmsPhysics Letters A, 1968
- The onset of superconductivity in the time dependent Ginzburg-Landau theoryThe European Physical Journal A, 1968
- Phenomenological theory of the rounding of the resistive transition of superconductorsPhysics Letters A, 1968
- "Curie-Weiss" Behavior and Fluctuation Phenomena in the Resistive Transitions of Dirty SuperconductorsPhysical Review Letters, 1968
- The resistivity of a superconductor in its normal stateThe European Physical Journal A, 1968
- Ideal resistive transition of a superconductorPhysics Letters A, 1967