High Rate X-Ray Fluorescence Analysis by Pulsed Excitation

Abstract

We describe the application of pulsed X-ray excitation to X-ray fluorescence spectrometry as a method for increasing the output counting rate of the system by a substantial factor. Using a pulsed X-ray tube that is immediately turned off when a signal is detected, and held off during the pulse processing time, it is possible to eliminate the need for a pulse pile-up rejection. We have achieved output counting rates significantly greater than with conventional operation for equivalent shaping networks. No significant degradation in spectrometer resolution was observed at the increased counting rates.