Procedure for Stripping Anodic Oxide Films from Tantalum and Niobium
- 1 August 1964
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 35 (8), 1066-1067
- https://doi.org/10.1063/1.1718927
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A Submicron Sectioning Technique for Analyzing Diffusion Specimens of Tantalum and NiobiumJournal of Applied Physics, 1964
- The determination of the thickness, dielectric constant, and other properties of anodic oxide films on tantalum from the interference coloursProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1958
- The kinetics of formation and structure of anodic oxide films on tantalumActa Metallurgica, 1953