Niobium nanobridge dc SQUID
- 1 October 1980
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 37 (7), 656-658
- https://doi.org/10.1063/1.92026
Abstract
For the first time high‐resolution electron beam contamination lithography has been used to produce active sensing devices. dc SQUID’s (Superconducting quantum interference devices) with linewidths as small as 30 nm have demonstrated a minimum intrinsic energy resolution of 3h. This is the best value for any SQUID to date and approaches the limit ≈ h set by the uncertainty principle. The dependence of voltage noise on SQUID parameters is in agreement with a new small‐signal model of SQUID noise.Keywords
This publication has 8 references indexed in Scilit:
- All-Nb low-noise dc SQUID with 1-μm tunnel junctionsJournal of Applied Physics, 1980
- Josephson effect in Nb nanobridgesApplied Physics Letters, 1979
- An ultra-low-noise tunnel junction dc SQUIDApplied Physics Letters, 1979
- Superconducting weak linksReviews of Modern Physics, 1979
- Experiments on Ge-Sn barrier Josephson junctionsIEEE Transactions on Magnetics, 1979
- dc SQUID: Noise and optimizationJournal of Low Temperature Physics, 1977
- SQUIDs and their applicationsJournal of Physics E: Scientific Instruments, 1976
- Irreversibility and Generalized NoisePhysical Review B, 1951