Inversion kinetics for Kr-Xe bilayers on palladium
- 15 June 1982
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 25 (12), 7846-7849
- https://doi.org/10.1103/physrevb.25.7846
Abstract
The thermally activated inversion of Kr-Xe bilayers on Pd is studied with the use of photoemission and photon-excited Auger spectroscopy. Bilayers formed by the deposit of a monolayer or less of Xe on top of a monolayer of Kr on Pd at 49 K are shown to invert when the temperature is raised, with Xe coming in direct contact with the substrate. For a Pd(111) substrate the activation energy of this inversion process is determined: eV.
Keywords
This publication has 9 references indexed in Scilit:
- Orientation of Chemisorbed Molecules from Surface-Absorption Fine-Structure Measurements: CO and NO on Ni(100)Physical Review Letters, 1981
- Interaction between Closed-Shell Systems and Metal SurfacesPhysical Review Letters, 1981
- Distance-Dependent Relaxation Shifts of Photoemission and Auger Energies for Xe on Pd(001)Physical Review Letters, 1980
- Photoemission from physisorbed Co on clean and Xe-covered Al(111)Solid State Communications, 1980
- Surface Diffusion by an Atomic Exchange MechanismPhysical Review Letters, 1980
- Adsorption and coadsorption with oxygen of xenon on the (110) and (100) planes of tungstenSurface Science, 1980
- Photoemission from Physisorbed Xenon: Evidence for Lateral InteractionsPhysical Review Letters, 1978
- Core holes in chemisorbed atomsPhysical Review B, 1977
- Physical adsorption of xenon on Pd(100)Surface Science, 1971