Review of the JINR Electron Beam Ion Sources
- 1 April 1976
- journal article
- review article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 23 (2), 897-903
- https://doi.org/10.1109/tns.1976.4328375
Abstract
A review of the electron beam sources of highly-stripped ions, developed at the Joint Institute for Nuclear Research during 1967-75, is given. The effective experimental ionization cross sections of positive C, N. Ar, and Xe ions by electron impact are presented. Possible fields of application of electron beam ion sources are indicated.Keywords
This publication has 3 references indexed in Scilit:
- Multiply charged ion sourceNuclear Instruments and Methods, 1975
- Multi-ionization of neon, argon, and xenon and their ions by high-energy-electron impactPhysical Review A, 1974
- Electron-impact ionization cross-sections and ionization rate coefficients for atoms and ions from hydrogen to calciumThe European Physical Journal A, 1968