Fast-atom molecular secondary-ion mass spectrometry
- 1 December 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 54 (3), 237-247
- https://doi.org/10.1016/0168-1176(83)80012-3
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Secondary ion mass spectrometry of polymersInternational Journal of Mass Spectrometry and Ion Physics, 1983
- ‘Fast atom bombardment’—A rediscovered method for mass spectrometryJournal of Mass Spectrometry, 1982
- Fast atom bombardment mass spectrometryAnalytical Chemistry, 1982
- Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometryAnalytical Chemistry, 1982
- Characterization of solids and surfaces using ion beams and mass spectrometryProgress in Solid State Chemistry, 1981
- Characterization of polymeric thin films by low-damage secondary ion mass spectrometryApplications of Surface Science, 1981
- Molecular secondary ion mass spectrometry (SIMS)Journal of Vacuum Science and Technology, 1981
- Molecular secondary ion mass spectrometryAnalytical Chemistry, 1980
- Static secondary ion mass spectrometry of polymer systemsAnalytical Chemistry, 1980
- Properties and applications of saddle-field ion sourcesJournal of Vacuum Science and Technology, 1979