X-ray characterization of Au/Ni multilayer thin films
- 1 October 1992
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 219 (1), 63-68
- https://doi.org/10.1016/0040-6090(92)90724-p
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Enhanced elastic modulus in composition-modulated gold-nickel and copper-palladium foilsJournal of Applied Physics, 1977
- X-ray diffraction from one-dimensional superlattices in GaAs1−xPxcrystalsJournal of Applied Crystallography, 1973