Target backings for charged particle induced X-ray fluorescence analysis
- 15 June 1973
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 109 (3), 429-437
- https://doi.org/10.1016/0029-554x(73)90555-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Sensitivity versus target backings for elemental analysis by alpha excited X-ray emissionNuclear Instruments and Methods, 1972
- Construction of efficiency curves for semiconductor X-ray spectrometersNuclear Instruments and Methods, 1972
- An investigation of the analytical capabilities of X-ray emission induced by high energy alpha particlesNuclear Instruments and Methods, 1971
- X-ray analysis: Elemental trace analysis at the 10−12 g levelNuclear Instruments and Methods, 1970