Refinements to a Standard LEED-Auger System for the Analysis of Electron Emission at Low Primary Beam Energies
- 1 May 1972
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 43 (5), 731-734
- https://doi.org/10.1063/1.1685742
Abstract
Refinements to a basic three-grid LEED-Auger system are described which permit a more detailed analysis to be made of the electron emission from solids at low primary beam energies. This is accomplished by (i) cross modulation of electron gun and analyzer grids for suppression of unwanted signal, (ii) improving the collector efficiency for low energy electrons, and (iii) recording the second derivative of the energy distribution curve.Keywords
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