Some electrical properties and structural investigations of thin bismuth films evaporated in a high vacuum
- 1 August 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 17 (2), 199-205
- https://doi.org/10.1016/0040-6090(73)90128-4
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Zur Kinetik des KondensationsvorgangesCrystal Research and Technology, 1970
- Theory of thin film condensation part C: Aggregate size distribution in island filmsThin Solid Films, 1969
- Thickness-Dependent Oscillatory Behavior of Resistivity and Hall Coefficient in Thin Single-Crystal Bismuth FilmsJournal of Applied Physics, 1969
- Measurement of the Sheet Resistivity of a Square Wafer with a Square Four-Point ProbeReview of Scientific Instruments, 1960