Mechanical relaxation of organic monolayer films measured by force microscopy
- 4 May 1992
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 68 (18), 2790-2793
- https://doi.org/10.1103/physrevlett.68.2790
Abstract
Using the newly developed interfacial-force microscope, we present results for the first measurements of the mechanical relaxation of a Au supported, self-assembled monolayer film interacting with a microscopic tungsten tip. For a methyl-terminated n-alkanethiol film, we observe negligible adhesive film-tip interaction and complete passivation of tip-substrate bonding. The mechanical behavior of the film itself shows a time-dependent, elastic response.Keywords
This publication has 11 references indexed in Scilit:
- Molecular mechanisms associated with adhesion and contact angle hysteresis of monolayer surfacesThe Journal of Physical Chemistry, 1991
- A new force sensor incorporating force-feedback control for interfacial force microscopyReview of Scientific Instruments, 1991
- Interaction forces of a sharp tungsten tip with molecular films on silicon surfacesPhysical Review Letters, 1990
- Atom-Probe Field Ion MicroscopyPublished by Cambridge University Press (CUP) ,1990
- Chemical functionality in self-assembled monolayers: structural and electrochemical propertiesLangmuir, 1990
- Measuring the nanomechanical properties and surface forces of materials using an atomic force microscopeJournal of Vacuum Science & Technology A, 1989
- Formation of monolayer films by the spontaneous assembly of organic thiols from solution onto goldJournal of the American Chemical Society, 1989
- Tip Surface Interactions in STM and AFMPhysica Scripta, 1987
- The drainage of thin liquid films between solid surfacesThe Journal of Chemical Physics, 1985
- Adsorption of bifunctional organic disulfides on gold surfacesJournal of the American Chemical Society, 1983