The preparation of cross‐section specimens for transmission electron microscopy
- 1 January 1984
- journal article
- research article
- Published by Wiley in Journal of Electron Microscopy Technique
- Vol. 1 (1), 53-61
- https://doi.org/10.1002/jemt.1060010106
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Transmission electron microscopy studies of the polycrystalline silicon-SiO2 interfaceThin Solid Films, 1983
- Advances in Transmission Electron Microscope Techniques Applied to Device Failure AnalysisJournal of the Electrochemical Society, 1980
- Cross-sectional specimens for transmission electron microscopyJournal of Applied Physics, 1974