A High-Resolution X-ray Photoelectron Spectroscopy Study of Carbon-Nitrogen Impurity in Chemical Bath Deposited CdS Thin Films
- 1 April 1997
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 36 (4R), 2167-2175
- https://doi.org/10.1143/jjap.36.2167
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- CdS Thin Film Deposited in Iodide-Containing Chemical BathJapanese Journal of Applied Physics, 1995
- Accelerated publication 17.1% efficient Cu(In,Ga)Se2‐based thin‐film solar cellProgress In Photovoltaics, 1995
- Properties of chemical bath deposited CdS thin filmsSolar Energy Materials and Solar Cells, 1994
- Opto-electronic characteristics of chemically deposited cadmium sulphide thin filmsSemiconductor Science and Technology, 1988
- Some properties of thin films of chemically deposited cadmium sulphideSolar Energy Materials, 1985
- Growth Kinetics and Polymorphism of Chemically Deposited CdS FilmsJournal of the Electrochemical Society, 1980
- An ESCA Investigation of Ambident Ions and Tautomerism. N-Cyanobenzamides and Benzohydroxamic Acids.Acta Chemica Scandinavica, 1978
- X-ray photoelectron spectra and electronic structure of some diamine compoundsJournal of Electron Spectroscopy and Related Phenomena, 1977
- Nitrogen ls electron binding energies. Correlations with molecular orbital calculated nitrogen chargesInorganic Chemistry, 1969
- The Decomposition of Thiourea in Water SolutionsJournal of the American Chemical Society, 1956