An investigation into the use of electron back scattered diffraction to measure recrystallised fraction
- 18 June 1999
- journal article
- Published by Elsevier in Scripta Materialia
- Vol. 41 (2), 125-129
- https://doi.org/10.1016/s1359-6462(99)00051-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Applications of electron backscattered diffraction to studies of annealing of deformed metalsMaterials Science and Technology, 1997
- Methods for determining elastic strains from electron backscatter diffraction and electron channelling patternsMaterials Science and Technology, 1997
- Annealing twins in dilute Al[sbnd]Mn[sbnd]Si alloysPhilosophical Magazine Letters, 1995
- Deformation studies of metal matrix composites using electron backscatter patternsMaterials Science and Engineering: A, 1991