Sensitivity amplication by sample preconcentration in ion beam analysis
- 15 December 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 218 (1-3), 33-38
- https://doi.org/10.1016/0167-5087(83)90950-x
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A versatile charged particle activation technique for the analysis of the noble metalsJournal of Radioanalytical and Nuclear Chemistry, 1983