Analysis of evaporated silicon oxide films by means of (d, p) nuclear reactions and infrared spectrophotometry
- 16 June 1971
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 5 (3), 637-644
- https://doi.org/10.1002/pssa.2210050314
Abstract
No abstract availableKeywords
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