Accurate Masses andβ-Decay Schemes forP34andSi33

Abstract

By using delayed $\beta -\gamma$ coincidence techniques, the mass excesses of ${}_{}{}^{34}{}_{}{}^{}\mathrm{P}$ and ${}_{}{}^{33}{}_{}{}^{}\mathrm{Si}$ have been measured to be -24 546 ± 45 and -20 569 ± 50 keV, respectively, representing improvements in precision of a factor of 2 for ${}_{}{}^{34}{}_{}{}^{}\mathrm{P}$ and a factor of 4 for ${}_{}{}^{33}{}_{}{}^{}\mathrm{Si}$ over previous measurements. The first measurements of the high-energy $\gamma$ rays from ${}_{}{}^{34}{}_{}{}^{}\mathrm{P}$ decay with a Ge(Li) detector are presented, revealing three new $\beta$ branches. $\gamma$-ray energies (in keV) and relative intensities for the ${}_{}{}^{34}{}_{}{}^{}\mathrm{S}$ daughter transitions are 1787 ± 1 (0.30 ± 0.10), 1947.1 ± 1.5 (0.28 ± 0.10), 1987.2 ± 1.0 (1.0 ± 0.2), 2127.4 (100.0 ± 0.3), 4073.4 ± 1.5 (0.46 ± 0.06), and 4114.0 ± 1.5 (1.2 ± 0.2). The ${}_{}{}^{34}{}_{}{}^{}\mathrm{S}$ excitation energies and relative $\beta$ branches are 2127.4 (100 ± 0.3), 3303.7 (<0.26), 3914.2 (0.30 ± 0.10), 4073.0 (0.76 ± 0.12), and 4114.5 (2.2 ± 0.3). For the decay of ${}_{}{}^{33}{}_{}{}^{}\mathrm{Si}$, energies and relative intensities of $\gamma$ rays were measured to be 415.8 ± 0.6 (6.7 ± 0.6), 1431.4 (13.1 ± 1.0), 1847.5 (100 ± 1), and 2537.5 (9.3 ± 0.8), representing excitation energies and relative $\beta$-ray intensities to the ${}_{}{}^{33}{}_{}{}^{}\mathrm{P}$ daughter states of 1431.4 (${5.1}_{-2.4\mathrm{}}^{+1.0\mathrm{}}$), 1847.5 (${100}_{-2.8\mathrm{}}^{+1.0\mathrm{}}$), and 2537.6 (10.5 ± 1.0). The half-lives of ${}_{}{}^{34}{}_{}{}^{}\mathrm{P}$ and ${}_{}{}^{33}{}_{}{}^{}\mathrm{Si}$ were determined by multiscaling $\gamma$-ray yields to be 12.45 ± 0.10 and 6.11 ± 0.21 sec, respectively. Combined with an earlier result, a half-life of 6.18 ± 0.18 sec is adopted for ${}_{}{}^{33}{}_{}{}^{}\mathrm{Si}$. The transverse mass relationship of Garvey, using the present measurements for ${}_{}{}^{34}{}_{}{}^{}\mathrm{P}$ and

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