Low temperature growth and characterization of ZnSe films grown on GaAs
- 1 May 1993
- journal article
- Published by Springer Nature in Journal of Electronic Materials
- Vol. 22 (5), 501-503
- https://doi.org/10.1007/bf02661621
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Detection of compound formation at the ZnSe/GaAs interface using high resolution transmission electron microscopy (HRTEM)Journal of Crystal Growth, 1991
- MOVPE of ZnSe using organometallic allyl selenium precursorsJournal of Crystal Growth, 1991
- Surface science studies of semiconductor growth processesJournal of Vacuum Science & Technology B, 1988