Peak-width calculations for equi-inclination diffraction geometry

Abstract

A relationship has been derived for computing scan widths required for integrated-intensity measurements under equi-inclination diffraction conditions. The amount of crystal rotation, Δφ , is given in terms of known or measurable diffraction parameters. Curves illustrate the variation of Δφ with diffractometer angles γ and μ , and with empirical parameters related to spectral dispersion, crystal and source size, and mosaic spread.