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ELLIPSOMETRIC STUDY OF a-Si:H NUCLEATION, GROWTH, AND INTERFACES
Home
Publications
ELLIPSOMETRIC STUDY OF a-Si:H NUCLEATION, GROWTH, AND INTERFACES
ELLIPSOMETRIC STUDY OF a-Si:H NUCLEATION, GROWTH, AND INTERFACES
RC
R. W. Collins
R. W. Collins
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1 January 1989
book chapter
Published by
World Scientific Pub Co Pte Ltd
p.
1003-1044
https://doi.org/10.1142/9789814434157_0036
Abstract
No abstract available
Keywords
EVOLUTION
NUCLEATION
SURFACE ROUGHNESS
BEHAVIOR
ELLIPSOMETRY
MICROSTRUCTURAL
FORMATION
DEPOSITION
Cited by 9 articles