Collective emission degradation behavior of carbon nanotube thin-film electron emitters
- 13 August 2001
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 79 (7), 1036-1038
- https://doi.org/10.1063/1.1392982
Abstract
The current-induced emission degradation of a carbon nanotube (CNT) thin-film electron emitter is studied under constant emission current for different current levels, using a scanning anode field emission microscope. A permanent emission degradation is observed for emission currents higher than 300 nA per CNT and is associated with resistive heating at the CNT–substrate interface for the sample under investigation. A second field-induced emission degradation mechanism, associated with the removal of CNTs from the substrate, is also reported.Keywords
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