Backscattering measurements and surface roughness
- 1 July 1974
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 119, 287-289
- https://doi.org/10.1016/0029-554x(74)90766-6
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Microanalysis of Materials by Backscattering SpectrometryScience, 1972
- A universal goniometer for channeling experimentsNuclear Instruments and Methods, 1972
- Defect studies in crystals by means of channelingCanadian Journal of Physics, 1968