Importance of internal electric fields in TSCD experiments in amorphous solids
- 16 June 1972
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 11 (2), K141-K144
- https://doi.org/10.1002/pssa.2210110258
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Determination of deep centers in silicon by thermally stimulated conductivity measurementsSolid-State Electronics, 1969
- Electrical conduction in evaporated silicon oxide filmsThin Solid Films, 1969
- CALCULATION OF ELECTRON TRAP DEPTHS FROM THERMOLUMINESCENCE MAXIMACanadian Journal of Chemistry, 1954