Surface-enhanced Raman spectroscopy of chemical vapor deposited diamond films

Abstract

By using surface‐enhanced Raman spectroscopy it was possible to clearly identify very thin diamond and amorphous carbon coatings which were not detectable by normal Raman spectroscopy. A very small amount of silver was sputtered onto the surface of thin diamond depositions. Raman spectra measured through the silver layer exhibited the 1332 cm⁻¹ diamond line and broadbands due to other forms of carbon. Raman scattering measured through silver coatings directly on the silicon substrate revealed extremely thin layers of amorphous carbon.