A comparison of some important surface properties of elemental and tetrahedrally coordinated compound semiconductors
- 1 September 1975
- journal article
- research article
- Published by Taylor & Francis in C R C Critical Reviews in Solid State Sciences
- Vol. 5 (2), 189-229
- https://doi.org/10.1080/10408437508243480
Abstract
(1975). A comparison of some important surface properties of elemental and tetrahedrally coordinated compound semiconductors. C R C Critical Reviews in Solid State Sciences: Vol. 5, No. 2, pp. 189-229.Keywords
This publication has 76 references indexed in Scilit:
- The adsorption of oxygen on silicon (111) surfaces. ISurface Science, 1973
- The adsorption of oxygen on a clean silicon surfaceSurface Science, 1973
- Principles of Surface ChemistryJournal of the Electrochemical Society, 1972
- Combined Low-Energy Electron Diffraction and Auger Electron Spectroscopy Studies of Si, Ge, GaAs, and InSb SurfacesJournal of Vacuum Science and Technology, 1971
- Auger Studies of Cleaved (111) Silicon SurfacesJournal of Vacuum Science and Technology, 1970
- Thin reaction layers and the surface structure of silicon (111)Surface Science, 1969
- Leed study of a nickel induced surface structure on silicon (111)Surface Science, 1967
- Structural Properties of Cleaved Silicon and Germanium SurfacesJournal of Applied Physics, 1963
- Low-Energy Electron Diffraction Study of Silicon Surface StructuresThe Journal of Chemical Physics, 1962
- Low Voltage Electron Diffraction Study of the Oxidation and Reduction of SiliconJournal of Applied Physics, 1962