Electron microscopy of reaction layers between SiC and Ti–6Al–4V after laser embedding
- 1 November 1998
- journal article
- Published by Elsevier in Acta Materialia
- Vol. 46 (17), 6205-6217
- https://doi.org/10.1016/s1359-6454(98)00265-1
Abstract
No abstract availableKeywords
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