On the Structure of Ge-Associated Defect Centers in Irradiated High Purity GeO2 and Ge-Doped SiO2 Glasses
- 1 January 1987
- journal article
- Published by Trans Tech Publications, Ltd. in Defect and Diffusion Forum
- Vol. 53-54, 469-476
- https://doi.org/10.4028/www.scientific.net/ddf.53-54.469