Size determination of semiconductor nanocrystallites in glasses by low frequency inelastic scattering (LOFIS)
- 7 September 1991
- journal article
- Published by Elsevier in Materials Science and Engineering B
- Vol. 9 (4), 417-420
- https://doi.org/10.1016/0921-5107(91)90064-3
Abstract
No abstract availableThis publication has 9 references indexed in Scilit:
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