Measurements and modelling of the barrier heights and ideality factors in the metal/conducting polymer composite Schottky device
- 1 April 1999
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 85 (7), 3671-3676
- https://doi.org/10.1063/1.369732
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- X-ray photoelectron spectroscopic studies of conducting polyaniline, poly bisphenol A carbonate and electrochemically synthesized composite of the twoVacuum, 1998
- Electrically Conducting Polyaniline and Polyaniline/Polycarbonate Composite Films: Preparation, Characterization and Electrical Conductivity MeasurementsPhysica Status Solidi (a), 1998
- Schottky contacts on a highly doped organic semiconductorPhysical Review B, 1995
- Some recent studies on metal/polyaniline schottky devicesJournal of Applied Polymer Science, 1992
- Barrier inhomogeneities at Schottky contactsJournal of Applied Physics, 1991
- Metal/semiconductive polymer Schottky deviceApplied Physics Letters, 1991
- Conducting polymer blends: polythiophene and polypyrrole blends with polystyrene and poly(bisphenol A carbonate)Macromolecules, 1990
- Charge transport in the “emeraldine” form of polyanilineSynthetic Metals, 1989
- Raman and infrared spectra of polyanilineSynthetic Metals, 1987
- Metal - Polyacetylene Schottky Barrier DiodesMolecular Crystals and Liquid Crystals, 1984