Stress compensation in Ga1−xAlxAs1−yPy LPE layers on GaAs substrates

Abstract
Epitaxial layers of Ga0.66Al0.34As1−yPy with y ≤ ≈ 0.04 have been grown in order to demonstrate that it is possible to adjust the lattice parameter of a mixed III‐V layer such that it is matched with the GaAs substrate at room temperature. The amount of stress compensation has been determined as a function of y, as well as estimates of the layer thicknesses required to suppress the formation of misfit dislocations.