Measurement of local thickness by electron energy-loss spectroscopy
- 1 January 1987
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 21 (3), 231-244
- https://doi.org/10.1016/0304-3991(87)90148-3
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Measurement of foil thickness and extinction distance by convergent beam transmission electron microscopyPhilosophical Magazine A, 1985
- Fourier deconvolution of electron energy-loss spectraProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1985
- Mass thickness determination by electron energy loss for quantitative X‐ray microanalysis in biologyJournal of Microscopy, 1984
- Methods for specimen thickness determination in electron microscopyUltramicroscopy, 1984
- Measurement of partial specific thickness (net thickness) of critical-point-dried cultured fibroblast by energy analysisUltramicroscopy, 1981
- The determination of foil thickness by scanning transmission electron microscopyPhysica Status Solidi (a), 1975
- Interaction of 25 keV Electrons with the Nucleic Acid Bases, Adenine, Thymine, and Uracil. I. Outer Shell ExcitationThe Journal of Chemical Physics, 1972
- Inelastic Collisions of Fast Charged Particles with Atoms and Molecules—The Bethe Theory RevisitedReviews of Modern Physics, 1971
- Thickness Estimation of Carbon Films by Electron Microscopy of Transverse Sections and Optical Density MeasurementsJournal of Applied Physics, 1968
- Elektronen-Energieverlustmessungen und Berechnung optischer KonstantenThe European Physical Journal A, 1968