An automatic focusing and stigmating system for the SEM
- 1 January 1979
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 12 (1), 35-38
- https://doi.org/10.1088/0022-3735/12/1/011
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Computer Measurement of Particle Sizes in Electron Microscope ImagesIEEE Transactions on Systems, Man, and Cybernetics, 1976
- Controlled focusing and stigmating in the conventional and scanning transmission electron microscopeJournal of Physics E: Scientific Instruments, 1975
- A digital computer method for revealing directional information in images (in electron microscopy)Journal of Physics E: Scientific Instruments, 1975