MILES: Multiple-Instance Learning via Embedded Instance Selection
Top Cited Papers
- 30 October 2006
- journal article
- research article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Pattern Analysis and Machine Intelligence
- Vol. 28 (12), 1931-1947
- https://doi.org/10.1109/tpami.2006.248
Abstract
Multiple-instance problems arise from the situations where training class labels are attached to sets of samples (named bags), instead of individual samples within each bag (called instances). Most previous multiple-instance learning (MIL) algorithms are developed based on the assumption that a bag is positive if and only if at least one of its instances is positive. Although the assumption works well in a drug activity prediction problem, it is rather restrictive for other applications, especially those in the computer vision area. We propose a learning method, MILES (multiple-instance learning via embedded instance selection), which converts the multiple-instance learning problem to a standard supervised learning problem that does not impose the assumption relating instance labels to bag labels. MILES maps each bag into a feature space defined by the instances in the training bags via an instance similarity measure. This feature mapping often provides a large number of redundant or irrelevant features. Hence, 1-norm SVM is applied to select important features as well as construct classifiers simultaneously. We have performed extensive experiments. In comparison with other methods, MILES demonstrates competitive classification accuracy, high computation efficiency, and robustness to labeling uncertaintyKeywords
This publication has 39 references indexed in Scilit:
- Towards Inferring Protein Interactions: Challenges and SolutionsEURASIP Journal on Advances in Signal Processing, 2006
- A Bayesian approach to joint feature selection and classifier designIEEE Transactions on Pattern Analysis and Machine Intelligence, 2004
- On the selection and classification of independent featuresIEEE Transactions on Pattern Analysis and Machine Intelligence, 2003
- Automatic linguistic indexing of pictures by a statistical modeling approachPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Feature selection for multiclass discrimination via mixed-integer linear programmingIEEE Transactions on Pattern Analysis and Machine Intelligence, 2003
- 10.1162/153244303322533214Applied Physics Letters, 2000
- Wrappers for feature subset selectionArtificial Intelligence, 1997
- Solving the multiple instance problem with axis-parallel rectanglesArtificial Intelligence, 1997
- Texture features for browsing and retrieval of image dataIEEE Transactions on Pattern Analysis and Machine Intelligence, 1996
- Divergence based feature selection for multimodal class densitiesIEEE Transactions on Pattern Analysis and Machine Intelligence, 1996