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Growth-parameter dependence of deep levels in molecular-beam-epitaxial GaAs
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Growth-parameter dependence of deep levels in molecular-beam-epitaxial GaAs
Growth-parameter dependence of deep levels in molecular-beam-epitaxial GaAs
RS
R.A. Stall
R.A. Stall
CW
C.E.C. Wood
C.E.C. Wood
PK
P.D. Kirchner
P.D. Kirchner
LE
L.F. Eastman
L.F. Eastman
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1 January 1980
journal article
Published by
Institution of Engineering and Technology (IET)
in
Electronics Letters
Vol. 16
(5)
,
171-172
https://doi.org/10.1049/el:19800122
Abstract
Deep levels in GaAs grown by molecular-beam epitaxy have been examined. Dependence of both electron and hole trap densities on growth parameters such as growth temperature have been obtained.
Keywords
GAAS
MBE
GROWTH TEMPERATURE
ELECTRON TRAP DENSITIES
HOLE TRAP DENSITIES
DEEP LEVELS
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Open Access
Cited by 66 articles