Interfacial reactions in Ti/SiC layered films with and without thin diffusion barriers
- 1 June 1990
- journal article
- Published by Elsevier in Materials Science and Engineering: A
- Vol. 126 (1-2), 225-230
- https://doi.org/10.1016/0921-5093(90)90127-o
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Interfacial reactions in metal matrix composites studied with a novel techniqueJournal of Materials Science Letters, 1989
- Solid phase reactions in free-standing layered M-Si (M=Ti, V, Cr, Co) filmsJournal of Applied Physics, 1988