Measurement of Threshold Electrons in the Photoionization of Ar, Kr, and Xe
- 15 June 1967
- journal article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 46 (12), 4995-4996
- https://doi.org/10.1063/1.1840677
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Spectroscopic Study of the Early Afterglow in Helium: Visible Bands and Hopfield Continuum*Journal of the Optical Society of America, 1966
- Partial photoionization cross sections for molecular oxygenPhysics Letters, 1965
- Photoelectron Spectroscopy with a Spherical Analyzer. The Vibrational Energy Levels ofPhysical Review Letters, 1965
- Flux Distribution of the Hopfield Helium Continuum from the Photoionization of Ar, Kr, and XeJournal of the Optical Society of America, 1965
- Threshold Laws for Processes of AutoionizationThe Journal of Chemical Physics, 1964
- Retarding Potential Measurements of Electrons Photoemitted by N2, CO, and O2The Journal of Chemical Physics, 1964
- Experimental Photoionization Cross Sections in Argon from Threshold to 280 ÅJournal of the Optical Society of America, 1964
- Determination of Ionization Potentials by Photoelectron Energy MeasurementThe Journal of Chemical Physics, 1962
- Photon Impact Studies of Molecules Using a Mass SpectrometerThe Journal of Chemical Physics, 1958
- On the Analysis of Electronic Velocities by Electrostatic MeansPhysical Review B, 1929