On the structure of indium oxide-tin oxide transparent conducting films by electron diffraction and electron spectroscopy
- 1 February 1973
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 15 (2), 141-148
- https://doi.org/10.1016/0040-6090(73)90036-9
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Auger Electron Spectroscopy Investigations of the Surface Chemical Composition of Vanadium, the Vanadium Oxides, and Oxidized Vanadium: Chemical Shift and Peak Intensity AnalysisThe Journal of Chemical Physics, 1972
- Some Recent Advances in Photoelectron SpectroscopyApplied Spectroscopy, 1971
- Fluorescence elimination in x-ray diffractometry with solid state detectorsMaterials Research Bulletin, 1970
- Preparation of SnO2 Films by D. C. Glow Discharge SputteringJapanese Journal of Applied Physics, 1969
- Proton-irradiation darkening of rock powders: Contamination and temperature effects, and applications to solar-wind darkening of the MoonJournal of Geophysical Research, 1967