Supporting Evidence for Long-Range Defect Migration in the Stage-I Recovery of Copper

Abstract
From the measurement of electrical-resistivity changes, an irradiation doping effect upon the stage-I recovery of thermal-neutron damage in copper has been observed. Because small defect concentrations (3.5×108 atomic concentration of Frenkel pairs) were employed, the results strongly support the idea of long-range defect migration in the stage-I recovery. Isochronal-annealing studies of dilute damage characterize the recovery in stage ID and IE, and the results can be interpreted in terms of long-range interstitial migration in stage IE.