High-Resolution Interband-Energy Measurements from Electroreflectance Spectra
- 26 July 1971
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 27 (4), 188-190
- https://doi.org/10.1103/PhysRevLett.27.188
Abstract
We present a new method for obtaining interband energies to high accuracy from electroreflectance spectra taken under general experimental conditions. The method does not require optical constants or a Kramers-Kronig analysis; hence it is particularly suitable for new materials such as chalcopyrites, binary alloys, and amorphous semiconductors.Keywords
This publication has 18 references indexed in Scilit:
- Ge-Aqueous-Electrolyte Interface: Electrical Properties and Electroreflectance at the Fundamental Direct ThresholdPhysical Review B, 1971
- Piezoelectric effects in electroreflectanceSolid State Communications, 1970
- Ge-Aqueous-Electrolyte Interface: Electrical Properties and Electroreflectance at the Fundamental Direct ThresholdPhysical Review B, 1970
- Asymptotic convolution integral for electric field effects on the interband dielectric functionSolid State Communications, 1970
- Excitonic Electroreflectance of CuClPhysica Status Solidi (b), 1970
- Interference of Light- and Heavy-Hole Contributions to the Electroreflectance Spectrum of GermaniumPhysical Review Letters, 1969
- Quantum Dielectric Theory of Electronegativity in Covalent Systems. II. Ionization Potentials and Interband Transition EnergiesPhysical Review B, 1969
- Quantum Dielectric Theory of Electronegativity in Covalent Systems. I. Electronic Dielectric ConstantPhysical Review B, 1969
- Combined Investigation of Nonuniform-Field Electroreflectance and Surface Galvanomagnetic Properties in GermaniumPhysical Review B, 1969
- Low Temperature Electro-Reflectance Spectra of Germanium in Spectral Region from 0.7 to 2.6 eVJournal of the Physics Society Japan, 1969