Moire' Patterns and Two-Dimensional Aliasing in Line Scanner Data Acquisition Systems
- 1 January 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Geoscience Electronics
- Vol. 12 (1), 1-8
- https://doi.org/10.1109/tge.1974.294324
Abstract
The basic mechanism underlying the generation of Moire' patterns in line scanner data acquisition systems is examined. A general expression is developed in terms of typical system parameters for the reproduced image of such systems and the interaction of the image spectrum; the raster frequency and digital sampling frequency of the A/D conversion process are discussed and examples given. System design requirements for avoiding Moire' pattern generation and two-dimensional aliasing are discussed.Keywords
This publication has 9 references indexed in Scilit:
- Resolution Testing of Coherent Optical Systems by Means of Linear GratingsApplied Optics, 1970
- Spatial and Temporal Analysis of Scanned SystemsApplied Optics, 1970
- Alias-free randomly timed sampling of stochastic processesIEEE Transactions on Information Theory, 1970
- A Numerical Technique Of Data Retrieval From Moire Or Photoelastic PatternsPublished by SPIE-Intl Soc Optical Eng ,1969
- Aliasing in sampled hologramsProceedings of the IEEE, 1968
- Moiré effects in computer-generated hologramsProceedings of the IEEE, 1967
- Sampling, data transmission, and the Nyquist rateProceedings of the IEEE, 1967
- Study and Experimental Investigation on Sampling Rate and Aliasing in Time-Division Telemetry SystemsIRE Transactions on Space Electronics and Telemetry, 1962
- A Theory of Scanning and Its Relation to the Characteristics of the Transmitted Signal in Telephotography and TelevisionBell System Technical Journal, 1934