Statistical design centering and tolerancing using parametric sampling
- 1 July 1981
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 28 (7), 692-702
- https://doi.org/10.1109/tcs.1981.1085029
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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